Runtime validation of Transactional Memory Systems

Kaiyu Chen, Sharad Malik, Priyadarsan Patra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

Transactional Memory (TM) has been proposed as a promising solution to effectively harness the increasing processing power of emerging multi/many-core systems. While there has been considerable research on the design and implementation of TM systems, it remains to be shown how to address the validation challenge of such systems in face of increasing design bugs and dynamic errors. This paper proposes a runtime validation methodology for ensuring the end-to-end correctness of a TM system. We use an extended constraint graph model to capture the correctness of a transactional execution, and provide efficient hardware support to perform online checking of this constraint graph. We describe the design ideas as well as the key optimization techniques to make this approach practical. Experiments based on a state-of-the-art TM system framework show that our design effectively performs system-level runtime validation with relatively small overhead.

Original languageEnglish (US)
Title of host publicationProceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008
Pages750-756
Number of pages7
DOIs
StatePublished - Aug 25 2008
Event9th International Symposium on Quality Electronic Design, ISQED 2008 - San Jose, CA, United States
Duration: Mar 17 2008Mar 19 2008

Publication series

NameProceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008

Other

Other9th International Symposium on Quality Electronic Design, ISQED 2008
CountryUnited States
CitySan Jose, CA
Period3/17/083/19/08

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Chen, K., Malik, S., & Patra, P. (2008). Runtime validation of Transactional Memory Systems. In Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008 (pp. 750-756). [4479832] (Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008). https://doi.org/10.1109/ISQED.2008.4479832