Rough semiconductor electrode: A new percolation problem

Morrel H. Cohen, Micha Tomkiewicz

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

We show that current flow through a rough interface with an exhaustion layer of controllable width can be idealized into a novel percolation problem. For an infinitely rough interface between two perfect conductors and a layer of finite conductivity separating the two, there exists a thickness t* such that the normalized resistance R=0 for t<t*, R(t-t*)s for tt*, and Rt for tt*, where s is a universal constant that will vary only with the topology of the interface. We formulate the scaling relations for a real interface and for the practical situation where the separating layer is an exhaustion layer of a semiconductor and where t can be controlled by an applied voltage.

Original languageEnglish (US)
Pages (from-to)7097-7100
Number of pages4
JournalPhysical Review B
Volume26
Issue number12
DOIs
StatePublished - Jan 1 1982
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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