Abstract
Systematic device performance and air stability comparison of inverted architecture polythiophene:fullerene photovoltaic cells with eight different electron-collecting layers (ECLs) and two hole-collecting layers are presented in this study. Regardless of the ECL, we achieved an efficiency of over 3.5% and lifetime of over 1000 h. These results indicate the relative interchangeability of various solution-processed ECLs. Long-term (>5000 h) air exposure revealed a secondary failure mechanism of inverted cells, which is assigned to hindered exciton harvesting. Notably, devices with a polymeric hole-collecting layer and Ag/Al electrode exhibited the longest lifetime (defined as 80% of the initial performance) of 4000 h, compared with 3000 h for MoO3/Ag/Al.
Original language | English (US) |
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Article number | 6664999 |
Pages (from-to) | 265-270 |
Number of pages | 6 |
Journal | IEEE Journal of Photovoltaics |
Volume | 4 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2014 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
Keywords
- Degradation
- interface phenomena
- organic semiconductors
- oxygen
- solar cells