Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices

Eszter Voroshazi; Ilaria Cardinaletti; Griet Uytterhoeven; Afshin Hadipour; Barry P. Rand; Tom Aernouts

doi:10.1109/PVSC.2013.6745136

Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices

Eszter Voroshazi, Ilaria Cardinaletti, Griet Uytterhoeven, Afshin Hadipour, Barry P. Rand, Tom Aernouts

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

Systematic device performance and air stability comparison of inverted architecture P3HT:PCBM cells with six different electron collecting layers (ECL) and two hole collecting layers are presented in this study. Regardless of the ECL, we achieved an efficiency of over 3.5% and lifetime of over 1000 h. These results prove the interchangeability of different ECLs (TiOx, ZnO and PFN). Over 5000 h long air exposure revealed a secondary failure of inverted cells. Notably, devices with PEDOT:PSS/Ag/Al electrode exhibited the longest lifetime of 4000 h compared to 3000 h with MoO₃/Ag/Al.

Original language	English (US)
Title of host publication	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	3212-3215
Number of pages	4
ISBN (Print)	9781479932993
DOIs	https://doi.org/10.1109/PVSC.2013.6745136
State	Published - Jan 1 2013
Externally published	Yes
Event	39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States Duration: Jun 16 2013 → Jun 21 2013

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/Territory	United States
City	Tampa, FL
Period	6/16/13 → 6/21/13

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Control and Systems Engineering
Industrial and Manufacturing Engineering

Access to Document

10.1109/PVSC.2013.6745136

Cite this

Voroshazi, E., Cardinaletti, I., Uytterhoeven, G., Hadipour, A., Rand, B. P., & Aernouts, T. (2013). Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 (pp. 3212-3215). [6745136] (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2013.6745136

Voroshazi, Eszter ; Cardinaletti, Ilaria ; Uytterhoeven, Griet et al. / Role of electron and hole collecting buffer layers on the stability of inverted polymer : Fullerene photovoltaic devices. 39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. pp. 3212-3215 (Conference Record of the IEEE Photovoltaic Specialists Conference).

@inproceedings{3d6444019218441bbf5fc63dcfe338c7,

title = "Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices",

abstract = "Systematic device performance and air stability comparison of inverted architecture P3HT:PCBM cells with six different electron collecting layers (ECL) and two hole collecting layers are presented in this study. Regardless of the ECL, we achieved an efficiency of over 3.5% and lifetime of over 1000 h. These results prove the interchangeability of different ECLs (TiOx, ZnO and PFN). Over 5000 h long air exposure revealed a secondary failure of inverted cells. Notably, devices with PEDOT:PSS/Ag/Al electrode exhibited the longest lifetime of 4000 h compared to 3000 h with MoO3/Ag/Al.",

author = "Eszter Voroshazi and Ilaria Cardinaletti and Griet Uytterhoeven and Afshin Hadipour and Rand, {Barry P.} and Tom Aernouts",

year = "2013",

month = jan,

day = "1",

doi = "10.1109/PVSC.2013.6745136",

language = "English (US)",

isbn = "9781479932993",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "3212--3215",

booktitle = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013",

address = "United States",

note = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013 ; Conference date: 16-06-2013 Through 21-06-2013",

}

Voroshazi, E, Cardinaletti, I, Uytterhoeven, G, Hadipour, A, Rand, BP & Aernouts, T 2013, Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices. in 39th IEEE Photovoltaic Specialists Conference, PVSC 2013., 6745136, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 3212-3215, 39th IEEE Photovoltaic Specialists Conference, PVSC 2013, Tampa, FL, United States, 6/16/13. https://doi.org/10.1109/PVSC.2013.6745136

Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices. / Voroshazi, Eszter; Cardinaletti, Ilaria; Uytterhoeven, Griet et al.
39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. p. 3212-3215 6745136 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Role of electron and hole collecting buffer layers on the stability of inverted polymer

T2 - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013

AU - Voroshazi, Eszter

AU - Cardinaletti, Ilaria

AU - Uytterhoeven, Griet

AU - Hadipour, Afshin

AU - Rand, Barry P.

AU - Aernouts, Tom

PY - 2013/1/1

Y1 - 2013/1/1

N2 - Systematic device performance and air stability comparison of inverted architecture P3HT:PCBM cells with six different electron collecting layers (ECL) and two hole collecting layers are presented in this study. Regardless of the ECL, we achieved an efficiency of over 3.5% and lifetime of over 1000 h. These results prove the interchangeability of different ECLs (TiOx, ZnO and PFN). Over 5000 h long air exposure revealed a secondary failure of inverted cells. Notably, devices with PEDOT:PSS/Ag/Al electrode exhibited the longest lifetime of 4000 h compared to 3000 h with MoO3/Ag/Al.

AB - Systematic device performance and air stability comparison of inverted architecture P3HT:PCBM cells with six different electron collecting layers (ECL) and two hole collecting layers are presented in this study. Regardless of the ECL, we achieved an efficiency of over 3.5% and lifetime of over 1000 h. These results prove the interchangeability of different ECLs (TiOx, ZnO and PFN). Over 5000 h long air exposure revealed a secondary failure of inverted cells. Notably, devices with PEDOT:PSS/Ag/Al electrode exhibited the longest lifetime of 4000 h compared to 3000 h with MoO3/Ag/Al.

UR - http://www.scopus.com/inward/record.url?scp=84896458899&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84896458899&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2013.6745136

DO - 10.1109/PVSC.2013.6745136

M3 - Conference contribution

AN - SCOPUS:84896458899

SN - 9781479932993

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 3212

EP - 3215

BT - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 16 June 2013 through 21 June 2013

ER -

Voroshazi E, Cardinaletti I, Uytterhoeven G, Hadipour A, Rand BP, Aernouts T. Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc. 2013. p. 3212-3215. 6745136. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2013.6745136

Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices

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