@inproceedings{3d6444019218441bbf5fc63dcfe338c7,
title = "Role of electron and hole collecting buffer layers on the stability of inverted polymer: Fullerene photovoltaic devices",
abstract = "Systematic device performance and air stability comparison of inverted architecture P3HT:PCBM cells with six different electron collecting layers (ECL) and two hole collecting layers are presented in this study. Regardless of the ECL, we achieved an efficiency of over 3.5% and lifetime of over 1000 h. These results prove the interchangeability of different ECLs (TiOx, ZnO and PFN). Over 5000 h long air exposure revealed a secondary failure of inverted cells. Notably, devices with PEDOT:PSS/Ag/Al electrode exhibited the longest lifetime of 4000 h compared to 3000 h with MoO3/Ag/Al.",
keywords = "Degradation, Interface phenomena, Organic semiconductors, Oxygen, Photovoltaic cells",
author = "Eszter Voroshazi and Ilaria Cardinaletti and Griet Uytterhoeven and Afshin Hadipour and Rand, {Barry P.} and Tom Aernouts",
year = "2013",
doi = "10.1109/PVSC.2013.6745136",
language = "English (US)",
isbn = "9781479932993",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "3212--3215",
booktitle = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013",
address = "United States",
note = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013 ; Conference date: 16-06-2013 Through 21-06-2013",
}