Abstract
The effect of fabrication environment on current-voltage (I-V) characteristics of nominally symmetric Mg:Ag/Alq3/Mg:Ag structures was investigated. The structure fabricated under stringent vacuum conditions exhibits symmetric I-V characteristics. The results imply that the contacts formed by evaporating Mg:Ag on Alq3, or Alq3 on Mg:Ag, are equally efficient and that the perturbation caused to the organic layer by the top deposited metal has no significant impact on the injection process.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1523-1527 |
| Number of pages | 5 |
| Journal | Advanced Materials |
| Volume | 11 |
| Issue number | 18 |
| DOIs | |
| State | Published - Jan 1 1999 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering