Robust Narrow-Gap Semiconducting Behavior in Square-Net La3Cd2As6

Mario M. Piva, Marein C. Rahn, Sean M. Thomas, Brian L. Scott, Pascoal G. Pagliuso, Joe D. Thompson, Leslie M. Schoop, Filip Ronning, Priscila F.S. Rosa

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Narrow-gap semiconductors are sought-after materials due to their potential for long-wavelength detectors, thermoelectrics, and more recently nontrivial topology. Here, we report the synthesis and characterization of a new family of narrow-gap semiconductors, R3Cd2As6 (R = La and Ce). Single-crystal X-ray diffraction at room temperature reveals that the As square nets distort and Cd vacancies order in a monoclinic superstructure. A putative charge-density ordered state sets in at 279 K in La3Cd2As6 and at 136 K in Ce3Cd2As6 and is accompanied by a substantial increase in the electrical resistivity in both compounds. The resistivity of the La member increases by 13 orders of magnitude on cooling, which points to a remarkably clean semiconducting ground state. Our results suggest that light square-net materials within an I4/mmm parent structure are promising clean narrow-gap semiconductors.

Original languageEnglish (US)
Pages (from-to)4122-4127
Number of pages6
JournalChemistry of Materials
Volume33
Issue number11
DOIs
StatePublished - Jun 8 2021

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Chemical Engineering(all)
  • Materials Chemistry

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