Robust ellipse and spheroid fitting

Jieqi Yu; Sanjeev R. Kulkarni; H. Vincent Poor

doi:10.1016/j.patrec.2011.11.025

Robust ellipse and spheroid fitting

Jieqi Yu, Sanjeev R. Kulkarni, H. Vincent Poor

Research output: Contribution to journal › Article

22 Scopus citations

Abstract

Ellipse and ellipsoid fitting has been extensively researched and has broad applications. Traditional ellipse fitting methods provide accurate estimation of ellipse parameters in the case of low noise. However, their performance is compromised when the noise level or the ellipse eccentricity are high. In this paper, an algorithm based on the geometric definition of an ellipse/spheroid (a special class of ellipsoid) is proposed. It performs well in high-noise, and high-eccentricity cases. The efficacy of the new algorithm is demonstrated through simulations.

Original language	English (US)
Pages (from-to)	492-499
Number of pages	8
Journal	Pattern Recognition Letters
Volume	33
Issue number	5
DOIs	https://doi.org/10.1016/j.patrec.2011.11.025
State	Published - Apr 1 2012

All Science Journal Classification (ASJC) codes

Software
Signal Processing
Computer Vision and Pattern Recognition
Artificial Intelligence

Keywords

Curve fitting
Parameter estimation
Surface fitting

Access to Document

10.1016/j.patrec.2011.11.025

Cite this

Yu, J., Kulkarni, S. R., & Poor, H. V. (2012). Robust ellipse and spheroid fitting. Pattern Recognition Letters, 33(5), 492-499. https://doi.org/10.1016/j.patrec.2011.11.025

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