Reverse engineering digital circuits using functional analysis

Pramod Subramanyan, Nestan Tsiskaridze, Kanika Pasricha, Dillon Reisman, Adriana Susnea, Sharad Malik

Research output: Chapter in Book/Report/Conference proceedingConference contribution

40 Scopus citations

Abstract

Integrated circuits (ICs) are now designed and fabricated in a globalized multi-vendor environment making them vulnerable to malicious design changes, the insertion of hardware trojans/malware and intellectual property (IP) theft. Algorithmic reverse engineering of digital circuits can mitigate these concerns by enabling analysts to detect malicious hardware, verify the integrity of ICs and detect IP violations. In this paper, we present a set of algorithms for the reverse engineering of digital circuits starting from an unstructured netlist and resulting in a high-level netlist with components such as register files, counters, adders and subtracters. Our techniques require no manual intervention and experiments show that they determine the functionality of more than 51% and up to 93% of the gates in each of the practical test circuits that we examine.

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe, DATE 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1277-1280
Number of pages4
ISBN (Print)9783981537000
DOIs
StatePublished - Jan 1 2013
Event16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013 - Grenoble, France
Duration: Mar 18 2013Mar 22 2013

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013
CountryFrance
CityGrenoble
Period3/18/133/22/13

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Subramanyan, P., Tsiskaridze, N., Pasricha, K., Reisman, D., Susnea, A., & Malik, S. (2013). Reverse engineering digital circuits using functional analysis. In Proceedings - Design, Automation and Test in Europe, DATE 2013 (pp. 1277-1280). [6513710] (Proceedings -Design, Automation and Test in Europe, DATE). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.7873/date.2013.264