Abstract
We irradiated with photons from a 60Co source a double-sided d.c.-coupled silicon strip detector and several test structures fabricated at CSEM. We measured the leakage currents and the interstrip and backside capacitances. Up to a maximum dose of 1 Mrad, the current densities are always below 350 nA/cm2, mostly due to thermally generated surface currents. The interstrip capacitances increase at most 17% with respect to not irradiated detectors, while the backside capacitances do not change.
Original language | English (US) |
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Pages (from-to) | 1309-1318 |
Number of pages | 10 |
Journal | La Rivista del Nuovo Cimento |
Volume | 109 |
Issue number | 9 |
DOIs | |
State | Published - Sep 1996 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Nuclear and High Energy Physics
- Astronomy and Astrophysics