Abstract
In this study, we introduce a model to characterize electron scattering in an electrostatic analyzer. We show that electrons between 0.5 and 30 keV scatter from internal surfaces to produce a response up to ∼20% of the ideal, unscattered response. We compare our model results to laboratory data from the Jovian Auroral Distribution Experiment-Electron sensor onboard the NASA Juno mission. Our model reproduces the measured energy-angle response of the instrument well. Understanding and quantifying this scattering process is beneficial to the analysis of scientific data as well as future instrument optimization.
| Original language | English (US) |
|---|---|
| Article number | 105109 |
| Journal | Review of Scientific Instruments |
| Volume | 84 |
| Issue number | 10 |
| DOIs | |
| State | Published - Oct 2013 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Instrumentation