In this study, we introduce a model to characterize electron scattering in an electrostatic analyzer. We show that electrons between 0.5 and 30 keV scatter from internal surfaces to produce a response up to ∼20% of the ideal, unscattered response. We compare our model results to laboratory data from the Jovian Auroral Distribution Experiment-Electron sensor onboard the NASA Juno mission. Our model reproduces the measured energy-angle response of the instrument well. Understanding and quantifying this scattering process is beneficial to the analysis of scientific data as well as future instrument optimization.
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