Abstract
The layering critical points of a multilayer absorbed solid film are examined with the use of a renormalization group. The critical temperature Tc,n, of the nth layering transition will, for large n, be less than the roughening temperature, TR, of the corresponding interface between bulk phases by an amount proportional to 1ln2n. The layering critical points are in the universality class of the two-dimensional Ising model.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1371-1376 |
| Number of pages | 6 |
| Journal | Physical Review B |
| Volume | 30 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1984 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
Fingerprint
Dive into the research topics of 'Renormalization-group analysis of layering transitions in solid films'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver