Renormalization-group analysis of layering transitions in solid films

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Abstract

The layering critical points of a multilayer absorbed solid film are examined with the use of a renormalization group. The critical temperature Tc,n, of the nth layering transition will, for large n, be less than the roughening temperature, TR, of the corresponding interface between bulk phases by an amount proportional to 1ln2n. The layering critical points are in the universality class of the two-dimensional Ising model.

Original languageEnglish (US)
Pages (from-to)1371-1376
Number of pages6
JournalPhysical Review B
Volume30
Issue number3
DOIs
StatePublished - Jan 1 1984
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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