Reliability of active-matrix organic light-emitting-diode arrays with amorphous silicon thin-film transistor backplanes on clear plastic

Bahman Hekmatshoar; Alex Z. Kattamis; Kunigunde H. Cherenack; Ke Long; Jian Zhang Chen; Sigurd Wagner; James C. Sturm; Kamala Rajan; Michael Hack

doi:10.1109/LED.2007.910800

Reliability of active-matrix organic light-emitting-diode arrays with amorphous silicon thin-film transistor backplanes on clear plastic

Bahman Hekmatshoar, Alex Z. Kattamis, Kunigunde H. Cherenack, Ke Long, Jian Zhang Chen, Sigurd Wagner, James C. Sturm, Kamala Rajan, Michael Hack

Research output: Contribution to journal › Article › peer-review

39 Scopus citations

Abstract

We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 °C using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of light emission over time.

Original language	English (US)
Pages (from-to)	63-66
Number of pages	4
Journal	IEEE Electron Device Letters
Volume	29
Issue number	1
DOIs	https://doi.org/10.1109/LED.2007.910800
State	Published - Jan 2008

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Keywords

Active matrix
Active-matrix organic light-emitting-diode (AMOLED) display
Amorphous silicon
Clear plastic
Stability
Thin-film transistor

Access to Document

10.1109/LED.2007.910800

Cite this

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title = "Reliability of active-matrix organic light-emitting-diode arrays with amorphous silicon thin-film transistor backplanes on clear plastic",

abstract = "We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 °C using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of light emission over time.",

keywords = "Active matrix, Active-matrix organic light-emitting-diode (AMOLED) display, Amorphous silicon, Clear plastic, Stability, Thin-film transistor",

author = "Bahman Hekmatshoar and Kattamis, \{Alex Z.\} and Cherenack, \{Kunigunde H.\} and Ke Long and Chen, \{Jian Zhang\} and Sigurd Wagner and Sturm, \{James C.\} and Kamala Rajan and Michael Hack",

note = "Funding Information: Manuscript received July 12, 2007; revised October 8, 2007. This work was supported by the U.S. Display Consortium. The review of this letter was arranged by Editor P. Yu. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.",

year = "2008",

month = jan,

doi = "10.1109/LED.2007.910800",

language = "English (US)",

volume = "29",

pages = "63--66",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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AU - Hekmatshoar, Bahman

AU - Kattamis, Alex Z.

AU - Cherenack, Kunigunde H.

AU - Long, Ke

AU - Chen, Jian Zhang

AU - Wagner, Sigurd

AU - Sturm, James C.

AU - Rajan, Kamala

AU - Hack, Michael

N1 - Funding Information: Manuscript received July 12, 2007; revised October 8, 2007. This work was supported by the U.S. Display Consortium. The review of this letter was arranged by Editor P. Yu. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.

PY - 2008/1

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N2 - We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 °C using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of light emission over time.

AB - We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 °C using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of light emission over time.

KW - Active matrix

KW - Active-matrix organic light-emitting-diode (AMOLED) display

KW - Amorphous silicon

KW - Clear plastic

KW - Stability

KW - Thin-film transistor

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Reliability of active-matrix organic light-emitting-diode arrays with amorphous silicon thin-film transistor backplanes on clear plastic

Abstract

All Science Journal Classification (ASJC) codes

Keywords

Access to Document

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