Reliability of active-matrix organic light-emitting-diode arrays with amorphous silicon thin-film transistor backplanes on clear plastic

Bahman Hekmatshoar, Alex Z. Kattamis, Kunigunde H. Cherenack, Ke Long, Jian Zhang Chen, Sigurd Wagner, James C. Sturm, Kamala Rajan, Michael Hack

Research output: Contribution to journalArticle

32 Scopus citations

Abstract

We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 °C using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of light emission over time.

Original languageEnglish (US)
Pages (from-to)63-66
Number of pages4
JournalIEEE Electron Device Letters
Volume29
Issue number1
DOIs
StatePublished - Jan 1 2008

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Keywords

  • Active matrix
  • Active-matrix organic light-emitting-diode (AMOLED) display
  • Amorphous silicon
  • Clear plastic
  • Stability
  • Thin-film transistor

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