Relaxed SiGe layers with high Ge content by compliant substrates

H. Yin, R. L. Peterson, K. D. Hobart, S. R. Shieh, T. S. Duffy, J. C. Sturm

Research output: Contribution to journalConference articlepeer-review

Fingerprint

Dive into the research topics of 'Relaxed SiGe layers with high Ge content by compliant substrates'. Together they form a unique fingerprint.

Keyphrases

Material Science

Engineering