Relationship between hole trapping and interface state generation in metal-oxide-silicon structures

S. J. Wang, J. M. Sung, S. A. Lyon

Research output: Contribution to journalArticlepeer-review

81 Scopus citations

Fingerprint

Dive into the research topics of 'Relationship between hole trapping and interface state generation in metal-oxide-silicon structures'. Together they form a unique fingerprint.

Physics & Astronomy