Reducing test application time in high-level test generation

Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jha

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'Reducing test application time in high-level test generation'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science