We demonstrate significant reduction in the angular distribution of the far field diffraction pattern from a wavelength-sized slit when we place a narrow (sub-wavelength) strip in the middle of the slit. The higher directionality is attributed to constructive and destructive interference in the central and lateral parts of the diffracted beam, respectively. Measurements in the visible and near-IR agree well with numerical simulations.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering