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Rapid and minimally invasive quantum cascade wafer testing
Ekua N. Bentil
, Fatima Toor
, Anthony J. Hoffman
, Matthew D. Escarra
,
Claire F. Gmachl
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Keyphrases
Engineering Current Density
50%
Labour Time
50%
Level of Agreement
50%
Minimally Invasive Technique
50%
On-wafer Measurement
100%
Quality Testing
50%
Turn-on Voltage
50%
Wafer Quality
50%
Engineering
Laser Performance
100%
Wafer Quality
100%
Material Science
Density
100%
Optical Property
100%