Randomized benchmarking and process tomography for gate errors in a solid-state qubit

J. M. Chow, J. M. Gambetta, L. Tornberg, Jens Koch, Lev S. Bishop, A. A. Houck, B. R. Johnson, L. Frunzio, S. M. Girvin, R. J. Schoelkopf

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Abstract

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double π pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1±0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

Original languageEnglish (US)
Article number090502
JournalPhysical review letters
Volume102
Issue number9
DOIs
StatePublished - Mar 2 2009

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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    Chow, J. M., Gambetta, J. M., Tornberg, L., Koch, J., Bishop, L. S., Houck, A. A., Johnson, B. R., Frunzio, L., Girvin, S. M., & Schoelkopf, R. J. (2009). Randomized benchmarking and process tomography for gate errors in a solid-state qubit. Physical review letters, 102(9), [090502]. https://doi.org/10.1103/PhysRevLett.102.090502