Randomized benchmarking and process tomography for gate errors in a solid-state qubit

J. M. Chow; J. M. Gambetta; L. Tornberg; Jens Koch; Lev S. Bishop; A. A. Houck; B. R. Johnson; L. Frunzio; S. M. Girvin; R. J. Schoelkopf

doi:10.1103/PhysRevLett.102.090502

Randomized benchmarking and process tomography for gate errors in a solid-state qubit

J. M. Chow, J. M. Gambetta, L. Tornberg, Jens Koch, Lev S. Bishop, A. A. Houck, B. R. Johnson, L. Frunzio, S. M. Girvin, R. J. Schoelkopf

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193 Scopus citations

Abstract

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double π pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1±0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

Original language	English (US)
Article number	090502
Journal	Physical review letters
Volume	102
Issue number	9
DOIs	https://doi.org/10.1103/PhysRevLett.102.090502
State	Published - Mar 2 2009
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1103/PhysRevLett.102.090502

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@article{d131557eb02a491bb488281af5be4409,

title = "Randomized benchmarking and process tomography for gate errors in a solid-state qubit",

abstract = "We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double π pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1±0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.",

author = "Chow, {J. M.} and Gambetta, {J. M.} and L. Tornberg and Jens Koch and Bishop, {Lev S.} and Houck, {A. A.} and Johnson, {B. R.} and L. Frunzio and Girvin, {S. M.} and Schoelkopf, {R. J.}",

year = "2009",

month = mar,

day = "2",

doi = "10.1103/PhysRevLett.102.090502",

language = "English (US)",

volume = "102",

journal = "Physical review letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "9",

}

TY - JOUR

T1 - Randomized benchmarking and process tomography for gate errors in a solid-state qubit

AU - Chow, J. M.

AU - Gambetta, J. M.

AU - Tornberg, L.

AU - Koch, Jens

AU - Bishop, Lev S.

AU - Houck, A. A.

AU - Johnson, B. R.

AU - Frunzio, L.

AU - Girvin, S. M.

AU - Schoelkopf, R. J.

PY - 2009/3/2

Y1 - 2009/3/2

N2 - We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double π pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1±0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

AB - We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double π pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1±0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

UR - http://www.scopus.com/inward/record.url?scp=63149105997&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=63149105997&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.102.090502

DO - 10.1103/PhysRevLett.102.090502

M3 - Article

C2 - 19392502

AN - SCOPUS:63149105997

SN - 0031-9007

VL - 102

JO - Physical review letters

JF - Physical review letters

IS - 9

M1 - 090502

ER -

Randomized benchmarking and process tomography for gate errors in a solid-state qubit

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All Science Journal Classification (ASJC) codes

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