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Raman scattering from hydrogenated amorphous silicon
S. A. Lyon
, R. J. Nemanich
Electrical and Computer Engineering
Princeton Materials Institute
Research output
:
Contribution to journal
›
Article
›
peer-review
7
Scopus citations
Overview
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Dive into the research topics of 'Raman scattering from hydrogenated amorphous silicon'. Together they form a unique fingerprint.
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Chemistry
Amorphous Silicon
100%
Hydrogen
50%
Phonon
50%
Silicon
50%
Liquid Film
25%
Single Crystalline Solid
25%
Raman Spectrum
25%
Relaxation
25%
Raman Intensity
25%
Ion Implantation
25%
Physics
Amorphous Silicon
100%
Raman Spectra
100%
Phonon
50%
Ion Implantation
25%
Temperature Dependence
25%
Single Crystal
25%
Material Science
Amorphous Silicon
100%
Silicon
50%
Film
25%
Ion Implantation
25%
Single Crystal
25%
Arsenic
25%
Keyphrases
Low-frequency Scattering
66%
Hydrogenated Silicon
33%
Two-phonon Processes
33%
Thermally Activated Relaxation
33%