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Radius measurement via super-resolution microscopy enables the development of a variable radii proximity labeling platform
James V. Oakley, Benito F. Buksh, David F. Fernández, Daniel G. Oblinsky, Ciaran P. Seath, Jacob B. Geri, Gregory D. Scholes, David W.C. MacMillan
Research output: Contribution to journal › Article › peer-review
32
Scopus
citations