Radius measurement via super-resolution microscopy enables the development of a variable radii proximity labeling platform
- James V. Oakley
- , Benito F. Buksh
- , David F. Fernández
- , Daniel G. Oblinsky
- , Ciaran P. Seath
- , Jacob B. Geri
- , Gregory D. Scholes
- , David W.C. MacMillan
Research output: Contribution to journal › Article › peer-review
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