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Radiation-hardness of VA1 with sub-micron process technology
M. Yokoyama, H. Aihara, M. Hazumi, H. Ishino, J. Kaneko, Y. Li, D. Marlow, S. Mikkelsen, E. Nygård, H. Tajima, J. Talebi, G. Varner, H. Yamamoto
Research output: Contribution to conference › Paper › peer-review