Radiation-hardness of VA1 with sub-micron process technology

M. Yokoyama, H. Aihara, M. Hazumi, H. Ishino, J. Kaneko, Y. Li, Daniel Robert Marlow, S. Mikkelsen, E. Nygård, H. Tajima, J. Talebi, G. Varner, H. Yamamoto

Research output: Contribution to conferencePaperpeer-review

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Engineering & Materials Science