Quantum imaging and spatial entanglement characterization with an EMCCD camera

Matthew Reichert, Hugo Defienne, Xiaohang Sun, Jason W. Fleischer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We utilize a single-photon sensitive electron multiplying CCD camera as a massively parallel coincidence counting apparatus to study spatial entanglement of photon pairs. This allows rapid measurement of transverse spatial entanglement in a fraction of the time required with traditional point-scanning techniques. We apply this technique to quantum experiments on entangled photon pairs: characterization of the evolution of entanglement upon propagation and measurement of one- and two-photon portions of the state transmitted through non-unitary (lossy) objects, and quantum phase imaging.

Original languageEnglish (US)
Title of host publicationUltrafast Bandgap Photonics II
EditorsMichael K. Rafailov
PublisherSPIE
ISBN (Electronic)9781510608870
DOIs
StatePublished - Jan 1 2017
EventUltrafast Bandgap Photonics II 2017 - Anaheim, United States
Duration: Apr 10 2017Apr 12 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10193
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherUltrafast Bandgap Photonics II 2017
CountryUnited States
CityAnaheim
Period4/10/174/12/17

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Reichert, M., Defienne, H., Sun, X., & Fleischer, J. W. (2017). Quantum imaging and spatial entanglement characterization with an EMCCD camera. In M. K. Rafailov (Ed.), Ultrafast Bandgap Photonics II [1019315] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10193). SPIE. https://doi.org/10.1117/12.2264864