Quantization of the diagonal resistance: Density gradients and the empirical Resistance rule in a 2D system

W. Pan, J. S. Xia, H. L. Stormer, D. C. Tsui, C. L. Vicente, E. D. Adams, N. S. Sullivan, L. N. Pfeiffer, K. W. Baldwin, K. W. West

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

We have observed quantization of the diagonal resistance, Rxx, at the edges of several quantum Hall states. Each quantized Rxx value is close to the difference between the two adjacent Hall plateaus in the off-diagonal resistance, Rxy. Peaks in Rxx occur at different positions in positive and negative magnetic fields. Practically all Rxx features can be explained quantitatively by a 1%/cm electron density gradient. Therefore, Rxx is determined by Rxy and unrelated to the diagonal resistivity ρxx. Our findings throw an unexpected light on the empirical resistivity rule for 2D systems.

Original languageEnglish (US)
Article number066808
JournalPhysical review letters
Volume95
Issue number6
DOIs
StatePublished - Aug 5 2005
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy

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