Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
- C. Barth
- , B. Seeber
- , A. Rack
- , C. Calzolaio
- , Y. Zhai
- , D. Matera
- , C. Senatore
Research output: Contribution to journal › Article › peer-review
15
Link opens in a new tab
Scopus
citations