Publisher Correction: An electrochemical thermal transistor (Nature Communications, (2018), 9, 1, (4510), 10.1038/s41467-018-06760-7)

Aditya Sood; Feng Xiong; Shunda Chen; Haotian Wang; Daniele Selli; Jinsong Zhang; Connor J. McClellan; Jie Sun; Davide Donadio; Yi Cui; Eric Pop; Kenneth E. Goodson

doi:10.1038/s41467-019-12471-4

Publisher Correction: An electrochemical thermal transistor (Nature Communications, (2018), 9, 1, (4510), 10.1038/s41467-018-06760-7)

Aditya Sood
, Feng Xiong
, Shunda Chen
, Haotian Wang
, Daniele Selli
, Jinsong Zhang
, Connor J. McClellan
, Jie Sun
, Davide Donadio
, Yi Cui
, Eric Pop
, Kenneth E. Goodson

Research output: Contribution to journal › Comment/debate › peer-review

Abstract

The original version of this Article contained an error in Fig. 2a in which the label on the y-axis incorrectly read ‘Al/MoS2OiS/2’ rather than the correct ‘Al/MoS2/SiO2’. Further, the original version contained an error in the last sentence of the seventh paragraph of the Discussion which incorrectly read ‘Reducing the temperature swing can have a significant effect on device reliability as the relationship between ∆T and the number of cycles to failure Nf is strongly non-linear³⁸, Nf ~ ∆T^-3,5’. The correct version states ‘∆T^-3,5’’ in place of ‘∆T^-3,5’’. This has been corrected in both the PDF and HTML versions of the Article.

Original language	English (US)
Article number	4465
Journal	Nature communications
Volume	10
Issue number	1
DOIs	https://doi.org/10.1038/s41467-019-12471-4
State	Published - Dec 1 2019
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Chemistry
General Biochemistry, Genetics and Molecular Biology
General
General Physics and Astronomy

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10.1038/s41467-019-12471-4

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@article{ad7ee5d086a44ae88b15aae13883624b,

title = "Publisher Correction: An electrochemical thermal transistor (Nature Communications, (2018), 9, 1, (4510), 10.1038/s41467-018-06760-7)",

abstract = "The original version of this Article contained an error in Fig. 2a in which the label on the y-axis incorrectly read {\textquoteleft}Al/MoS2OiS/2{\textquoteright} rather than the correct {\textquoteleft}Al/MoS2/SiO2{\textquoteright}. Further, the original version contained an error in the last sentence of the seventh paragraph of the Discussion which incorrectly read {\textquoteleft}Reducing the temperature swing can have a significant effect on device reliability as the relationship between ∆T and the number of cycles to failure Nf is strongly non-linear38, Nf \textasciitilde{} ∆T-3,5{\textquoteright}. The correct version states {\textquoteleft}∆T-3,5{\textquoteright}{\textquoteright} in place of {\textquoteleft}∆T-3,5{\textquoteright}{\textquoteright}. This has been corrected in both the PDF and HTML versions of the Article.",

author = "Aditya Sood and Feng Xiong and Shunda Chen and Haotian Wang and Daniele Selli and Jinsong Zhang and McClellan, \{Connor J.\} and Jie Sun and Davide Donadio and Yi Cui and Eric Pop and Goodson, \{Kenneth E.\}",

note = "Publisher Copyright: {\textcopyright} 2019, The Author(s).",

year = "2019",

month = dec,

day = "1",

doi = "10.1038/s41467-019-12471-4",

language = "English (US)",

volume = "10",

journal = "Nature communications",

issn = "2041-1723",

publisher = "Nature Research",

number = "1",

}

TY - JOUR

T1 - Publisher Correction

T2 - An electrochemical thermal transistor (Nature Communications, (2018), 9, 1, (4510), 10.1038/s41467-018-06760-7)

AU - Sood, Aditya

AU - Xiong, Feng

AU - Chen, Shunda

AU - Wang, Haotian

AU - Selli, Daniele

AU - Zhang, Jinsong

AU - McClellan, Connor J.

AU - Sun, Jie

AU - Donadio, Davide

AU - Cui, Yi

AU - Pop, Eric

AU - Goodson, Kenneth E.

PY - 2019/12/1

Y1 - 2019/12/1

N2 - The original version of this Article contained an error in Fig. 2a in which the label on the y-axis incorrectly read ‘Al/MoS2OiS/2’ rather than the correct ‘Al/MoS2/SiO2’. Further, the original version contained an error in the last sentence of the seventh paragraph of the Discussion which incorrectly read ‘Reducing the temperature swing can have a significant effect on device reliability as the relationship between ∆T and the number of cycles to failure Nf is strongly non-linear38, Nf ~ ∆T-3,5’. The correct version states ‘∆T-3,5’’ in place of ‘∆T-3,5’’. This has been corrected in both the PDF and HTML versions of the Article.

AB - The original version of this Article contained an error in Fig. 2a in which the label on the y-axis incorrectly read ‘Al/MoS2OiS/2’ rather than the correct ‘Al/MoS2/SiO2’. Further, the original version contained an error in the last sentence of the seventh paragraph of the Discussion which incorrectly read ‘Reducing the temperature swing can have a significant effect on device reliability as the relationship between ∆T and the number of cycles to failure Nf is strongly non-linear38, Nf ~ ∆T-3,5’. The correct version states ‘∆T-3,5’’ in place of ‘∆T-3,5’’. This has been corrected in both the PDF and HTML versions of the Article.

UR - https://www.scopus.com/pages/publications/85072707731

UR - https://www.scopus.com/pages/publications/85072707731#tab=citedBy

U2 - 10.1038/s41467-019-12471-4

DO - 10.1038/s41467-019-12471-4

M3 - Comment/debate

C2 - 31562331

AN - SCOPUS:85072707731

SN - 2041-1723

VL - 10

JO - Nature communications

JF - Nature communications

IS - 1

M1 - 4465

ER -

Publisher Correction: An electrochemical thermal transistor (Nature Communications, (2018), 9, 1, (4510), 10.1038/s41467-018-06760-7)

Abstract

All Science Journal Classification (ASJC) codes

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