TY - GEN
T1 - Programmable conductance switching and negative differential resistance in nanoscale organic films
AU - Graves-Abe, Troy
AU - Sturm, J. C.
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2005
Y1 - 2005
N2 - Thin (12-nm) self-assembled films of the insulating molecule 11-mercaptoimdecunoic acid (MUA) were contucted by gold electrodes in a sandwich structure, Current-voltage scans of the resulting devices revealed symmetric negative differential resistance (NDR) with peuks at ±3 V and large peak current densities of up to 104 A/cm2. Devices could be programmed reversibly into nonvolatile high- and low-conductance states by applying 1-ms voltage pulses of 4 V and 10 V, respectively; this conductunce could be probed non-destructively with voltages below 2.5 V. A conductance ratio of 103 between the high- and low-conductance states was measured. The NDR is attributed to the dynamic alteration of the device conductivity as the voltuge is scanned. Devices fabricated with one gold and one aluminum electrode displayed NDR only for positive bias on the gold electrode, which supports a model in which the observed programming and NDR is due to the movement of gold in the film leading to the formation and destruction of conductive pathways through the insulating layer.
AB - Thin (12-nm) self-assembled films of the insulating molecule 11-mercaptoimdecunoic acid (MUA) were contucted by gold electrodes in a sandwich structure, Current-voltage scans of the resulting devices revealed symmetric negative differential resistance (NDR) with peuks at ±3 V and large peak current densities of up to 104 A/cm2. Devices could be programmed reversibly into nonvolatile high- and low-conductance states by applying 1-ms voltage pulses of 4 V and 10 V, respectively; this conductunce could be probed non-destructively with voltages below 2.5 V. A conductance ratio of 103 between the high- and low-conductance states was measured. The NDR is attributed to the dynamic alteration of the device conductivity as the voltuge is scanned. Devices fabricated with one gold and one aluminum electrode displayed NDR only for positive bias on the gold electrode, which supports a model in which the observed programming and NDR is due to the movement of gold in the film leading to the formation and destruction of conductive pathways through the insulating layer.
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U2 - 10.1557/proc-871-i9.34
DO - 10.1557/proc-871-i9.34
M3 - Conference contribution
AN - SCOPUS:34249930060
SN - 155899825X
SN - 9781558998254
T3 - Materials Research Society Symposium Proceedings
SP - 376
EP - 380
BT - Organic Thin-Film Electronics
PB - Materials Research Society
T2 - 2005 MRS Spring Meeting
Y2 - 28 March 2005 through 1 April 2005
ER -