@inproceedings{20e2c3ea215946fd9d6751748988a072,
title = "Potential distribution in functionalized graphene devices probed by Kelvin probe force microscopy",
abstract = "Kelvin probe force microscopy was used to study the impact of contacts and topography on the local potential distribution on contacted, individual functionalized graphene sheets (FGS) deposited on a SiO 2/Si substrate. Negligible contact resistance is found at the graphene/Ti interface and a graphene resistance of 2.3 kΩ is extracted for a single sheet with sub-μm size. Pronounced steps in the topography, which we attribute to a variation of the spacing between graphene and substrate, result in a significant change of the local resistivity.",
keywords = "Functionalized graphene sheets, Kelvin probe force microscopy, electrical potential, local resistance",
author = "Liang Yan and Christian Punckt and Aksay, {Ilhan A.} and Wolfgang Mertin and Gerd Bacher",
year = "2011",
doi = "10.1063/1.3666628",
language = "English (US)",
isbn = "9780735410022",
series = "AIP Conference Proceedings",
pages = "819--820",
booktitle = "Physics of Semiconductors - 30th International Conference on the Physics of Semiconductors, ICPS-30",
note = "30th International Conference on the Physics of Semiconductors, ICPS-30 ; Conference date: 25-07-2010 Through 30-07-2010",
}