Post-silicon fault localization with satisfiability solvers

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English (US)
Title of host publication	Post-Silicon Validation and Debug
Publisher	Springer International Publishing
Pages	255-273
Number of pages	19
ISBN (Electronic)	9783319981161
ISBN (Print)	9783319981154
DOIs	https://doi.org/10.1007/978-3-319-98116-1_13
State	Published - Sep 1 2018

All Science Journal Classification (ASJC) codes

@inbook{ffa938cc6ad24ae09ec0158de515fffe,

title = "Post-silicon fault localization with satisfiability solvers",

author = "Georg Weissenbacher and Sharad Malik",

year = "2018",

month = sep,

day = "1",

doi = "10.1007/978-3-319-98116-1\_13",

language = "English (US)",

isbn = "9783319981154",

pages = "255--273",

booktitle = "Post-Silicon Validation and Debug",

publisher = "Springer International Publishing",

}

TY - CHAP

T1 - Post-silicon fault localization with satisfiability solvers

AU - Weissenbacher, Georg

AU - Malik, Sharad

PY - 2018/9/1

Y1 - 2018/9/1

UR - https://www.scopus.com/pages/publications/85063195731

UR - https://www.scopus.com/pages/publications/85063195731#tab=citedBy

U2 - 10.1007/978-3-319-98116-1_13

DO - 10.1007/978-3-319-98116-1_13

M3 - Chapter

SN - 9783319981154

SP - 255

EP - 273

BT - Post-Silicon Validation and Debug

PB - Springer International Publishing

ER -