Polarization-sensitive broadband photodetector using a black phosphorus vertical p-n junction

Hongtao Yuan, Xiaoge Liu, Farzaneh Afshinmanesh, Wei Li, Gang Xu, Jie Sun, Biao Lian, Alberto G. Curto, Guojun Ye, Yasuyuki Hikita, Zhixun Shen, Shou Cheng Zhang, Xianhui Chen, Mark Brongersma, Harold Y. Hwang, Yi Cui

Research output: Contribution to journalArticlepeer-review

996 Scopus citations


The ability to detect light over a broad spectral range is central to practical optoelectronic applications and has been successfully demonstrated with photodetectors of two-dimensional layered crystals such as graphene and MoS 2. However, polarization sensitivity within such a photodetector remains elusive. Here, we demonstrate a broadband photodetector using a layered black phosphorus transistor that is polarization-sensitive over a bandwidth from 400nm to 3,750nm. The polarization sensitivity is due to the strong intrinsic linear dichroism, which arises from the in-plane optical anisotropy of this material. In this transistor geometry, a perpendicular built-in electric field induced by gating can spatially separate the photogenerated electrons and holes in the channel, effectively reducing their recombination rate and thus enhancing the performance for linear dichroism photodetection. The use of anisotropic layered black phosphorus in polarization-sensitive photodetection might provide new functionalities in novel optical and optoelectronic device applications.

Original languageEnglish (US)
Pages (from-to)707-713
Number of pages7
JournalNature Nanotechnology
Issue number8
StatePublished - Aug 6 2015
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Bioengineering
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering
  • Biomedical Engineering
  • General Materials Science


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