Polarization dependence of light intensity distribution from nanometer metallic slits

C. H. Wei, Wunshain Fann, P. K. Wei, Jonas O. Tegenfeldt, Robert Hamilton Austin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, the near-field and far-field electric magnetic (EM) wave distributions of metallic slits was observed using tapered fiber probe and modelled using finite difference time domain (FDTD) computer simulations. The EM wave field distribution from rectangular slits with widths 100 nm, 300 nm, and 500 nm was mapped with excitation wavelength λ = 532 nm. λ/2 can be considered a characteristic length for the problem. From the experiments and FDTD simulation, E wave is found to be governed by the surface plasmon wave (SPW) which results in ill near field pattern and cannot be confined in the slit. On the contrary, E wave has a well-shaped field distribution and can be confined in the slit.

Original languageEnglish (US)
Title of host publicationCLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics
Subtitle of host publicationPhotonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages1
ISBN (Electronic)0780377664
DOIs
StatePublished - Jan 1 2003
Event5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003 - Taipei, Taiwan, Province of China
Duration: Dec 15 2003Dec 19 2003

Publication series

NamePacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Volume2

Other

Other5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003
CountryTaiwan, Province of China
CityTaipei
Period12/15/0312/19/03

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Wei, C. H., Fann, W., Wei, P. K., Tegenfeldt, J. O., & Austin, R. H. (2003). Polarization dependence of light intensity distribution from nanometer metallic slits. In CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings [1277218] (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2003.1277218