Polarization dependence of light intensity distribution from nanometer metallic slits

C. H. Wei; Wunshain Fann; P. K. Wei; Jonas O. Tegenfeldt; Robert H. Austin

doi:10.1109/CLEOPR.2003.1277218

Polarization dependence of light intensity distribution from nanometer metallic slits

C. H. Wei, Wunshain Fann, P. K. Wei, Jonas O. Tegenfeldt, Robert H. Austin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this work, the near-field and far-field electric magnetic (EM) wave distributions of metallic slits was observed using tapered fiber probe and modelled using finite difference time domain (FDTD) computer simulations. The EM wave field distribution from rectangular slits with widths 100 nm, 300 nm, and 500 nm was mapped with excitation wavelength λ = 532 nm. λ/2 can be considered a characteristic length for the problem. From the experiments and FDTD simulation, E_⊥ wave is found to be governed by the surface plasmon wave (SPW) which results in ill near field pattern and cannot be confined in the slit. On the contrary, E_∥ wave has a well-shaped field distribution and can be confined in the slit.

Original language	English (US)
Title of host publication	CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics
Subtitle of host publication	Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	677
Number of pages	1
ISBN (Electronic)	0780377664
DOIs	https://doi.org/10.1109/CLEOPR.2003.1277218
State	Published - 2003
Event	5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003 - Taipei, Taiwan, Province of China Duration: Dec 15 2003 → Dec 19 2003

Publication series

Name	Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Volume	2

Other

Other	5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003
Country/Territory	Taiwan, Province of China
City	Taipei
Period	12/15/03 → 12/19/03

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/CLEOPR.2003.1277218

Cite this

Wei, C. H., Fann, W., Wei, P. K., Tegenfeldt, J. O., & Austin, R. H. (2003). Polarization dependence of light intensity distribution from nanometer metallic slits. In CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings (pp. 677). Article 1277218 (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2003.1277218

Wei, C. H. ; Fann, Wunshain ; Wei, P. K. et al. / Polarization dependence of light intensity distribution from nanometer metallic slits. CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. pp. 677 (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest).

@inproceedings{8a4c2ef650cf4c92bbf8a13491f91a80,

title = "Polarization dependence of light intensity distribution from nanometer metallic slits",

abstract = "In this work, the near-field and far-field electric magnetic (EM) wave distributions of metallic slits was observed using tapered fiber probe and modelled using finite difference time domain (FDTD) computer simulations. The EM wave field distribution from rectangular slits with widths 100 nm, 300 nm, and 500 nm was mapped with excitation wavelength λ = 532 nm. λ/2 can be considered a characteristic length for the problem. From the experiments and FDTD simulation, E⊥ wave is found to be governed by the surface plasmon wave (SPW) which results in ill near field pattern and cannot be confined in the slit. On the contrary, E∥ wave has a well-shaped field distribution and can be confined in the slit.",

author = "Wei, {C. H.} and Wunshain Fann and Wei, {P. K.} and Tegenfeldt, {Jonas O.} and Austin, {Robert H.}",

note = "Publisher Copyright: {\textcopyright} 2003 IEEE.; 5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003 ; Conference date: 15-12-2003 Through 19-12-2003",

year = "2003",

doi = "10.1109/CLEOPR.2003.1277218",

language = "English (US)",

series = "Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "677",

booktitle = "CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics",

address = "United States",

}

Wei, CH, Fann, W, Wei, PK, Tegenfeldt, JO & Austin, RH 2003, Polarization dependence of light intensity distribution from nanometer metallic slits. in CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings., 1277218, Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest, vol. 2, Institute of Electrical and Electronics Engineers Inc., pp. 677, 5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003, Taipei, Taiwan, Province of China, 12/15/03. https://doi.org/10.1109/CLEOPR.2003.1277218

Polarization dependence of light intensity distribution from nanometer metallic slits. / Wei, C. H.; Fann, Wunshain; Wei, P. K. et al.
CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. p. 677 1277218 (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Polarization dependence of light intensity distribution from nanometer metallic slits

AU - Wei, C. H.

AU - Fann, Wunshain

AU - Wei, P. K.

AU - Tegenfeldt, Jonas O.

AU - Austin, Robert H.

PY - 2003

Y1 - 2003

N2 - In this work, the near-field and far-field electric magnetic (EM) wave distributions of metallic slits was observed using tapered fiber probe and modelled using finite difference time domain (FDTD) computer simulations. The EM wave field distribution from rectangular slits with widths 100 nm, 300 nm, and 500 nm was mapped with excitation wavelength λ = 532 nm. λ/2 can be considered a characteristic length for the problem. From the experiments and FDTD simulation, E⊥ wave is found to be governed by the surface plasmon wave (SPW) which results in ill near field pattern and cannot be confined in the slit. On the contrary, E∥ wave has a well-shaped field distribution and can be confined in the slit.

AB - In this work, the near-field and far-field electric magnetic (EM) wave distributions of metallic slits was observed using tapered fiber probe and modelled using finite difference time domain (FDTD) computer simulations. The EM wave field distribution from rectangular slits with widths 100 nm, 300 nm, and 500 nm was mapped with excitation wavelength λ = 532 nm. λ/2 can be considered a characteristic length for the problem. From the experiments and FDTD simulation, E⊥ wave is found to be governed by the surface plasmon wave (SPW) which results in ill near field pattern and cannot be confined in the slit. On the contrary, E∥ wave has a well-shaped field distribution and can be confined in the slit.

UR - http://www.scopus.com/inward/record.url?scp=84955285521&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84955285521&partnerID=8YFLogxK

U2 - 10.1109/CLEOPR.2003.1277218

DO - 10.1109/CLEOPR.2003.1277218

M3 - Conference contribution

AN - SCOPUS:84955285521

T3 - Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

SP - 677

BT - CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003

Y2 - 15 December 2003 through 19 December 2003

ER -

Wei CH, Fann W, Wei PK, Tegenfeldt JO, Austin RH. Polarization dependence of light intensity distribution from nanometer metallic slits. In CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2003. p. 677. 1277218. (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest). doi: 10.1109/CLEOPR.2003.1277218

Polarization dependence of light intensity distribution from nanometer metallic slits

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