TY - JOUR
T1 - Pixel-to-pixel variation on a calibrated PILATUS3-based multi-energy soft x-ray detector
AU - Vanmeter, P.
AU - Delgado-Aparicio, L. F.
AU - Reusch, L.
AU - Pablant, N.
AU - Maddox, J.
AU - Rissi, M.
AU - Luethi, B.
AU - Donath, T.
AU - Schulze-Briese, C.
AU - Hill, K.
AU - Den Hartog, D.
N1 - Publisher Copyright:
© 2018 Author(s).
PY - 2018/10/1
Y1 - 2018/10/1
N2 - A multi-energy soft x-ray pin-hole camera based on the PILATUS3 100 K x-ray detector has recently been installed on the Madison Symmetric Torus. This photon-counting detector consists of a two-dimensional array of ∼100 000 pixels for which the photon lower-threshold cutoff energy Ec can be independently set for each pixel. This capability allows the measurement of plasma x-ray emissivity in multiple energy ranges with a unique combination of spatial and spectral resolution and the inference of a variety of important plasma properties (e.g., Te, nZ, Zeff). The energy dependence of each pixel is calibrated for the 1.6-6 keV range by scanning individual trimbit settings, while the detector is exposed to fluorescence emission from Ag, In, Mo, Ti, V, and Zr targets. The resulting data for each line are then fit to a characteristic "S-curve" which determines the mapping between the 64 possible trimbit settings for each pixel. The statistical variation of this calibration from pixel-to-pixel was explored, and it was found that the discreteness of trimbit settings results in an effective threshold resolution of ΔE < 100 eV. A separate calibration was performed for the 4-14 keV range, with a resolution of ΔE < 200 eV.
AB - A multi-energy soft x-ray pin-hole camera based on the PILATUS3 100 K x-ray detector has recently been installed on the Madison Symmetric Torus. This photon-counting detector consists of a two-dimensional array of ∼100 000 pixels for which the photon lower-threshold cutoff energy Ec can be independently set for each pixel. This capability allows the measurement of plasma x-ray emissivity in multiple energy ranges with a unique combination of spatial and spectral resolution and the inference of a variety of important plasma properties (e.g., Te, nZ, Zeff). The energy dependence of each pixel is calibrated for the 1.6-6 keV range by scanning individual trimbit settings, while the detector is exposed to fluorescence emission from Ag, In, Mo, Ti, V, and Zr targets. The resulting data for each line are then fit to a characteristic "S-curve" which determines the mapping between the 64 possible trimbit settings for each pixel. The statistical variation of this calibration from pixel-to-pixel was explored, and it was found that the discreteness of trimbit settings results in an effective threshold resolution of ΔE < 100 eV. A separate calibration was performed for the 4-14 keV range, with a resolution of ΔE < 200 eV.
UR - https://www.scopus.com/pages/publications/85054836773
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U2 - 10.1063/1.5037347
DO - 10.1063/1.5037347
M3 - Article
C2 - 30399863
AN - SCOPUS:85054836773
SN - 0034-6748
VL - 89
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 10
M1 - 10G119
ER -