Pinning and roughening of domain walls in ising systems due to random impurities

David A. Huse, Christopher L. Henley

Research output: Contribution to journalArticlepeer-review

675 Scopus citations

Abstract

Randomly placed impurities that alter the local exchange couplings, but do not generate random fields or destroy the long-range order, roughen domain walls in Ising systems for dimensionality 53<d<5. They also pin (localize) the walls in energetically favorable positions. This drastically slows down the kinetics of ordering. The pinned domain wall is a new critical phenomenon governed by a zero-temperature fixed point. For d=2, the critical exponents for domain-wall pinning energies and roughness as a function of length scale are estimated from numerically generated ground states.

Original languageEnglish (US)
Pages (from-to)2708-2711
Number of pages4
JournalPhysical review letters
Volume54
Issue number25
DOIs
StatePublished - 1985
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy

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