Physical reproduction of materials with specified subsurface scattering

Miloš Hašan, Martin Fuchs, Wojciech Matusik, Hanspeter Pfister, Szymon Rusinkiewicz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

30 Scopus citations

Abstract

We investigate a complete pipeline for measuring, modeling, and fabricating objects with specified subsurface scattering behaviors. The process starts with measuring the scattering properties of a given set of base materials, determining their radial reflection and transmission profiles. We describe a mathematical model that predicts the profiles of different stackings of base materials, at arbitrary thicknesses. In an inverse process, we can then specify a desired reflection profile and compute a layered composite material that best approximates it. Our algorithm efficiently searches the space of possible combinations of base materials, pruning unsatisfactory states imposed by physical constraints. We validate our process by producing both homogeneous and heterogeneous composites fabricated using a multi-material 3D printer. We demonstrate reproductions that have scattering properties approximating complex materials.

Original languageEnglish (US)
Title of host publicationACM SIGGRAPH 2010 Papers, SIGGRAPH 2010
EditorsHugues Hoppe
PublisherAssociation for Computing Machinery, Inc
ISBN (Electronic)9781450302104
DOIs
StatePublished - Jul 26 2010
Event37th International Conference and Exhibition on Computer Graphics and Interactive Techniques, SIGGRAPH 2010 - Los Angeles, United States
Duration: Jul 26 2010Jul 30 2010

Publication series

NameACM SIGGRAPH 2010 Papers, SIGGRAPH 2010

Other

Other37th International Conference and Exhibition on Computer Graphics and Interactive Techniques, SIGGRAPH 2010
Country/TerritoryUnited States
CityLos Angeles
Period7/26/107/30/10

All Science Journal Classification (ASJC) codes

  • Computer Graphics and Computer-Aided Design
  • Computer Vision and Pattern Recognition
  • Software

Keywords

  • Bssrdf
  • Fabrication
  • Scattering
  • Translucency

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