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Phonon Scattering in Silicon by Multiple Morphological Defects: A Multiscale Analysis
Bruno Lorenzi, Riccardo Dettori, Marc T. Dunham, Claudio Melis, Rita Tonini, Luciano Colombo, Aditya Sood, Kenneth E. Goodson, Dario Narducci
Research output: Contribution to journal › Article › peer-review
11
Scopus
citations