Performance of the BELLE silicon vertex detector

R. Abe, H. Aihara, G. Alimonti, Y. Asano, A. Bakich, E. Banaś, A. Bozek, T. Browder, J. Dragic, C. Everton, C. Fukunaga, A. Gordon, H. Guler, J. Haba, K. Hara, T. Hara, N. Hastings, M. Hazumi, E. Heenan, T. HiguchiT. Hojo, H. Ishino, G. Iwai, P. Jałocha, J. Kaneko, P. Kapusta, T. Kawasaki, K. Korotuschenko, J. S. Lange, Y. Li, D. Marlow, T. Matsubara, H. Miyake, L. Moffitt, G. Moloney, S. Mori, Y. Nagashima, T. Nakadaira, T. Nakamura, Z. Natkaniec, S. Okuno, S. Olsen, W. Ostrowicz, H. Pałka, L. Peak, M. Rózańska, J. Ryuko, M. Sevior, K. Shimada, K. Sumisawa, S. Stanic, R. Stock, S. Swain, H. Tagomori, H. Tajima, S. Takahashi, F. Takasaki, N. Tamura, J. Tanaka, M. Tanaka, G. Taylor, T. Tomura, K. Trabelsi, T. Tsuboyama, Y. Tsujita, G. Varner, K. Varvell, H. Yamamoto, Y. Watanabe, Y. Yamada, M. Yokoyama, H. Zhao, D. Žontar

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

Using 6.8 fb-1 of data taken between October 1999 and July 2000, the performance of the silicon vertex detector (SVD) in the BELLE experiment is reviewed. The main purpose of the SVD is to make precise measurements of the B decay vertex position, which are essential for the observation of CP asymmetries. Excellent vertex resolution and a good detection efficiency are required for the SVD. Basic performance parameters such as signal pulse height, noise, strip yield, and intrinsic resolution are reported. The SVD performance parameters that are directly related to physics analysis such as track matching efficiency, impact parameter resolution, and vertex resolution are also shown.

Original languageEnglish (US)
Pages (from-to)997-1001
Number of pages5
JournalIEEE Transactions on Nuclear Science
Volume48
Issue number4 I
DOIs
StatePublished - Aug 2001
EventNuclear Science Symposium (NSS) 2000 - Lyon, France
Duration: Oct 15 2000Oct 20 2000

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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