Pattern formation resulting from faceted growth in zone-melted thin films

Loren Pfeiffer, Scott Paine, G. H. Gilmer, Wim Van Saarloos, K. W. West

Research output: Contribution to journalArticlepeer-review

52 Scopus citations

Abstract

We develop a model for the recrystallization of Si films that are traversed by a molten zone. The model simulates the branching behavior of low-angle grain-boundary defects in these films to a remarkable degree. The simulated subboundary patterns scale approximately as the square root of the scan velocity, in excellent agreement with experiment.

Original languageEnglish (US)
Pages (from-to)1944-1947
Number of pages4
JournalPhysical review letters
Volume54
Issue number17
DOIs
StatePublished - 1985
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy

Fingerprint

Dive into the research topics of 'Pattern formation resulting from faceted growth in zone-melted thin films'. Together they form a unique fingerprint.

Cite this