Papers from the 3rd international SiGe technology and device meeting (Princeton, New Jersey, USA, 15-17 May 2006) (ISTDM 2006)

J. Sturm; E. Fitzgerald; S. Koester; J. Kolodzey; J. Muroto; D. Paul; B. Tillack; S. Zaima; B. Ghyselen; S. Takagi

doi:10.1088/0268-1242/22/1/E01

Papers from the 3rd international SiGe technology and device meeting (Princeton, New Jersey, USA, 15-17 May 2006) (ISTDM 2006)

J. Sturm
, E. Fitzgerald
, S. Koester
, J. Kolodzey
, J. Muroto
, D. Paul
, B. Tillack
, S. Zaima
, B. Ghyselen
, S. Takagi

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Article number	E01
Pages (from-to)	E01
Journal	Semiconductor Science and Technology
Volume	22
Issue number	1
DOIs	https://doi.org/10.1088/0268-1242/22/1/E01
State	Published - Jan 1 2007

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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10.1088/0268-1242/22/1/E01

Cite this

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T1 - Papers from the 3rd international SiGe technology and device meeting (Princeton, New Jersey, USA, 15-17 May 2006) (ISTDM 2006)

AU - Sturm, J.

AU - Fitzgerald, E.

AU - Koester, S.

AU - Kolodzey, J.

AU - Muroto, J.

AU - Paul, D.

AU - Tillack, B.

AU - Zaima, S.

AU - Ghyselen, B.

AU - Takagi, S.

PY - 2007/1/1

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DO - 10.1088/0268-1242/22/1/E01

M3 - Editorial

AN - SCOPUS:34247205816

SN - 0268-1242

VL - 22

SP - E01

JO - Semiconductor Science and Technology

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Papers from the 3rd international SiGe technology and device meeting (Princeton, New Jersey, USA, 15-17 May 2006) (ISTDM 2006)

All Science Journal Classification (ASJC) codes

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