P-channel thin film transistor of microcrystalline silicon directly deposited at 320 °C

Y. Chen, K. Pangal, J. C. Sturm, S. Wagner

Research output: Contribution to conferencePaperpeer-review

Abstract

The p-channel thin film transistor (TFT) made in directly deposited microcrystalline silicon (μc-Si) is reported. The channel silicon is made by plasma enhanced vapor deposition. A four level mask process with specially designed mask was used in the TFT fabrication. The transfer and output characteristics of the p-channel TFT are shown.

Original languageEnglish (US)
Pages168-169
Number of pages2
StatePublished - 1999
EventProceedings of the 1999 57th Annual Device Research Conference Digest (DRC) - Santa Barbara, CA, USA
Duration: Jun 28 1999Jun 30 1999

Other

OtherProceedings of the 1999 57th Annual Device Research Conference Digest (DRC)
CitySanta Barbara, CA, USA
Period6/28/996/30/99

All Science Journal Classification (ASJC) codes

  • General Engineering

Fingerprint

Dive into the research topics of 'P-channel thin film transistor of microcrystalline silicon directly deposited at 320 °C'. Together they form a unique fingerprint.

Cite this