TY - JOUR
T1 - Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy
AU - Angelescu, D. E.
AU - Harrison, C. K.
AU - Trawick, M. L.
AU - Chaikin, P. M.
AU - Register, Richard Alan
AU - Adamson, D. H.
PY - 2004/2/1
Y1 - 2004/2/1
N2 - A novel microscopy analysis technique is presented, with applications in imaging two-dimensional grains and grain boundaries. The method allows the identification of grain shapes and orientations from large area micrographs, via the moire pattern obtained in a raster image. The observed moire pattern originates from the aliasing between a micrograph's regular sampling raster and the inherent periodicity of the elements forming the grain under study. The technique presented is very general, allowing grain analysis via many types of microscopy. We demonstrate it in this paper by using Tapping Mode Atomic Force Microscopy and Scanning Electron Microscopy on diblock copolymer thin films.
AB - A novel microscopy analysis technique is presented, with applications in imaging two-dimensional grains and grain boundaries. The method allows the identification of grain shapes and orientations from large area micrographs, via the moire pattern obtained in a raster image. The observed moire pattern originates from the aliasing between a micrograph's regular sampling raster and the inherent periodicity of the elements forming the grain under study. The technique presented is very general, allowing grain analysis via many types of microscopy. We demonstrate it in this paper by using Tapping Mode Atomic Force Microscopy and Scanning Electron Microscopy on diblock copolymer thin films.
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U2 - 10.1007/s00339-002-2012-5
DO - 10.1007/s00339-002-2012-5
M3 - Article
AN - SCOPUS:0742286255
SN - 0947-8396
VL - 78
SP - 387
EP - 392
JO - Applied Physics A: Materials Science and Processing
JF - Applied Physics A: Materials Science and Processing
IS - 3
ER -