Abstract
We present a comprehensive set of molecularly-resolved scanning tunneling microscopy data on the fundamentals of quasi-epitaxy of 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA) on graphite, Se-passivated GaAs(100) (2 × 1), and InAs(001) (4 × 2). Each of these substrates has smooth large-scale morphology; however, they possess differing surface energies that are seen to affect the growth mode of the PTCDA films. The mechanism of point-on-line coincidence is found to describe the orientation of all PTCDA films whereby the overlayer unit cell is matched one-dimensionally to substrate atomic planes.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 405-411 |
| Number of pages | 7 |
| Journal | Applied Surface Science |
| Volume | 123-124 |
| DOIs | |
| State | Published - Jan 1998 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Surfaces and Interfaces
Keywords
- PTCDA
- Point-on-line coincidence
- Quasi-epitaxy
- STM
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