One-shot focusing using the entropy as a merit function

V. Suca, S. Royo, A. Jordán, G. Bakos, K. Penev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a method for measuring focus aberrations on wide field telescopes based on an entropy analysis of a single image. First, we calibrate the system using the evolution of the entropy as a function of the position in the field and the focuser position. This gives us a model defining the tilt of the sensor and the field curvature. Then, using a single image at a given position of the focuser in which the mean defocus is unknown, we can compute the position where the focuser must be set in order to minimize the focus aberration over the whole field.

Original languageEnglish (US)
Title of host publicationModeling, Systems Engineering, and Project Management for Astronomy V
DOIs
StatePublished - Dec 1 2012
EventModeling, Systems Engineering, and Project Management for Astronomy V - Amsterdam, Netherlands
Duration: Jul 1 2012Jul 3 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8449
ISSN (Print)0277-786X

Other

OtherModeling, Systems Engineering, and Project Management for Astronomy V
CountryNetherlands
CityAmsterdam
Period7/1/127/3/12

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • Image metrics
  • One-shot focusing
  • Sensorless adaptive optics

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  • Cite this

    Suca, V., Royo, S., Jordán, A., Bakos, G., & Penev, K. (2012). One-shot focusing using the entropy as a merit function. In Modeling, Systems Engineering, and Project Management for Astronomy V [844914] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8449). https://doi.org/10.1117/12.927021