IIIB-7 Observation of Velocity Overshoot in Deep Submicrometer (0.08 µm) Channel MOSFETS in Si

S. Chou; D. A. Antoniadis; Henry I. Smith

doi:10.1109/T-ED.1985.22335

IIIB-7 Observation of Velocity Overshoot in Deep Submicrometer (0.08 µm) Channel MOSFETS in Si

S. Chou, D. A. Antoniadis, Henry I. Smith

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	2538
Number of pages	1
Journal	IEEE Transactions on Electron Devices
Volume	32
Issue number	11
DOIs	https://doi.org/10.1109/T-ED.1985.22335
State	Published - Nov 1985
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/T-ED.1985.22335

Cite this

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title = "IIIB-7 Observation of Velocity Overshoot in Deep Submicrometer (0.08 µm) Channel MOSFETS in Si",

author = "S. Chou and Antoniadis, {D. A.} and Smith, {Henry I.}",

year = "1985",

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language = "English (US)",

volume = "32",

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journal = "IEEE Transactions on Electron Devices",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

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AU - Antoniadis, D. A.

AU - Smith, Henry I.

PY - 1985/11

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SP - 2538

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 11

ER -

IIIB-7 Observation of Velocity Overshoot in Deep Submicrometer (0.08 µm) Channel MOSFETS in Si

All Science Journal Classification (ASJC) codes

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