IIIB-7 Observation of Velocity Overshoot in Deep Submicrometer (0.08 µm) Channel MOSFETS in Si

S. Chou, D. A. Antoniadis, Henry I. Smith

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)2538
Number of pages1
JournalIEEE Transactions on Electron Devices
Issue number11
StatePublished - Nov 1985
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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