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Observation of quantum fluctuations of charge on a quantum dot
D. Berman
, N. B. Zhitenev
, R. C. Ashoori
,
M. Shayegan
Electrical and Computer Engineering
Princeton Materials Institute
Research output
:
Contribution to journal
›
Article
›
peer-review
90
Scopus citations
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Keyphrases
Contact Conductance
50%
Gate Structure
50%
Lifetime Broadening
50%
Single Point Contact
50%
Thermal Broadening
50%
Voltage Biasing
50%
Engineering
Contact Conductance
50%
Contact Point
50%
Precise Measurement
50%
Semiconductor Quantum Dot
50%
Chemical Engineering
Single Electron Transistor
100%
Physics
Single Electron Transistor
50%