Observation of double line contrast in surface imaging

Nan Yao; John M. Cowley

doi:10.1002/jemt.1070200411

Observation of double line contrast in surface imaging

Nan Yao, John M. Cowley

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

The double line contrast of a singleatom height step observed in surface imaging for a single crystal in reflection electron microscopy is studied under a variety of experimental conditions. It is suggested that this abnormal contrast is directly associated with the dynamical electron diffraction process. The behavior of the double line contrast is closely related to the order of the Bragg reflected beam, and can be observed mostly under one of the two commonly cited resonance conditions. This phenomenon clearly reveals the differences in the surface imaging for various resonance conditions. Copyright1992 WileyLiss, Inc.

Original language	English (US)
Pages (from-to)	413-425
Number of pages	13
Journal	Microscopy Research and Technique
Volume	20
Issue number	4
DOIs	https://doi.org/10.1002/jemt.1070200411
State	Published - Feb 15 1992
Externally published	Yes

All Science Journal Classification (ASJC) codes

Instrumentation
Medical Laboratory Technology
Anatomy
Histology

Keywords

Contrast splitting
REM
RHEED
Surface resonance condition

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10.1002/jemt.1070200411

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title = "Observation of double line contrast in surface imaging",

abstract = "The double line contrast of a singleatom height step observed in surface imaging for a single crystal in reflection electron microscopy is studied under a variety of experimental conditions. It is suggested that this abnormal contrast is directly associated with the dynamical electron diffraction process. The behavior of the double line contrast is closely related to the order of the Bragg reflected beam, and can be observed mostly under one of the two commonly cited resonance conditions. This phenomenon clearly reveals the differences in the surface imaging for various resonance conditions. Copyright1992 WileyLiss, Inc.",

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T1 - Observation of double line contrast in surface imaging

AU - Yao, Nan

AU - Cowley, John M.

PY - 1992/2/15

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N2 - The double line contrast of a singleatom height step observed in surface imaging for a single crystal in reflection electron microscopy is studied under a variety of experimental conditions. It is suggested that this abnormal contrast is directly associated with the dynamical electron diffraction process. The behavior of the double line contrast is closely related to the order of the Bragg reflected beam, and can be observed mostly under one of the two commonly cited resonance conditions. This phenomenon clearly reveals the differences in the surface imaging for various resonance conditions. Copyright1992 WileyLiss, Inc.

AB - The double line contrast of a singleatom height step observed in surface imaging for a single crystal in reflection electron microscopy is studied under a variety of experimental conditions. It is suggested that this abnormal contrast is directly associated with the dynamical electron diffraction process. The behavior of the double line contrast is closely related to the order of the Bragg reflected beam, and can be observed mostly under one of the two commonly cited resonance conditions. This phenomenon clearly reveals the differences in the surface imaging for various resonance conditions. Copyright1992 WileyLiss, Inc.

KW - Contrast splitting

KW - REM

KW - RHEED

KW - Surface resonance condition

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EP - 425

JO - Microscopy Research and Technique

JF - Microscopy Research and Technique

IS - 4

ER -

Observation of double line contrast in surface imaging

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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