Observation of double line contrast in surface imaging

Nan Yao, John M. Cowley

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

The double line contrast of a singleatom height step observed in surface imaging for a single crystal in reflection electron microscopy is studied under a variety of experimental conditions. It is suggested that this abnormal contrast is directly associated with the dynamical electron diffraction process. The behavior of the double line contrast is closely related to the order of the Bragg reflected beam, and can be observed mostly under one of the two commonly cited resonance conditions. This phenomenon clearly reveals the differences in the surface imaging for various resonance conditions. Copyright1992 WileyLiss, Inc.

Original languageEnglish (US)
Pages (from-to)413-425
Number of pages13
JournalMicroscopy Research and Technique
Volume20
Issue number4
DOIs
StatePublished - Feb 15 1992
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Anatomy
  • Histology
  • Instrumentation
  • Medical Laboratory Technology

Keywords

  • Contrast splitting
  • REM
  • RHEED
  • Surface resonance condition

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