Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

T. N. Horsky; G. R. Brandes; K. F. Canter; C. B. Duke; S. F. Horng; A. Kahn; D. L. Lessor; A. P. Mills; A. Paton; K. Stevens; K. Stiles

doi:10.1103/PhysRevLett.62.1876

Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

T. N. Horsky
, G. R. Brandes
, K. F. Canter
, C. B. Duke
, S. F. Horng
, A. Kahn
, D. L. Lessor
, A. P. Mills
, A. Paton
, K. Stevens
, K. Stiles

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.

Original language	English (US)
Pages (from-to)	1876-1879
Number of pages	4
Journal	Physical review letters
Volume	62
Issue number	16
DOIs	https://doi.org/10.1103/PhysRevLett.62.1876
State	Published - 1989

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1103/PhysRevLett.62.1876

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Horsky, T. N., Brandes, G. R., Canter, K. F., Duke, C. B., Horng, S. F., Kahn, A., Lessor, D. L., Mills, A. P., Paton, A., Stevens, K., & Stiles, K. (1989). Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe. Physical review letters, 62(16), 1876-1879. https://doi.org/10.1103/PhysRevLett.62.1876

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abstract = "Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.",

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doi = "10.1103/PhysRevLett.62.1876",

language = "English (US)",

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T1 - Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

AU - Horsky, T. N.

AU - Brandes, G. R.

AU - Canter, K. F.

AU - Duke, C. B.

AU - Horng, S. F.

AU - Kahn, A.

AU - Lessor, D. L.

AU - Mills, A. P.

AU - Paton, A.

AU - Stevens, K.

AU - Stiles, K.

PY - 1989

Y1 - 1989

N2 - Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.

AB - Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.

UR - https://www.scopus.com/pages/publications/4243766398

UR - https://www.scopus.com/pages/publications/4243766398#tab=citedBy

U2 - 10.1103/PhysRevLett.62.1876

DO - 10.1103/PhysRevLett.62.1876

M3 - Article

C2 - 10039793

AN - SCOPUS:4243766398

SN - 0031-9007

VL - 62

SP - 1876

EP - 1879

JO - Physical review letters

JF - Physical review letters

IS - 16

ER -

Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

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