Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

T. N. Horsky; G. R. Brandes; K. F. Canter; C. B. Duke; S. F. Horng; A. Kahn; D. L. Lessor; A. P. Mills; A. Paton; K. Stevens; K. Stiles

doi:10.1103/PhysRevLett.62.1876

Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

T. N. Horsky, G. R. Brandes, K. F. Canter, C. B. Duke, S. F. Horng, A. Kahn, D. L. Lessor, A. P. Mills, A. Paton, K. Stevens, K. Stiles

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33 Scopus citations

Abstract

Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.

Original language	English (US)
Pages (from-to)	1876-1879
Number of pages	4
Journal	Physical review letters
Volume	62
Issue number	16
DOIs	https://doi.org/10.1103/PhysRevLett.62.1876
State	Published - 1989

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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Horsky, T. N., Brandes, G. R., Canter, K. F., Duke, C. B., Horng, S. F., Kahn, A., Lessor, D. L., Mills, A. P., Paton, A., Stevens, K., & Stiles, K. (1989). Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe. Physical review letters, 62(16), 1876-1879. https://doi.org/10.1103/PhysRevLett.62.1876

@article{32db815d94e04825a363085d754706cc,

title = "Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe",

abstract = "Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.",

author = "Horsky, \{T. N.\} and Brandes, \{G. R.\} and Canter, \{K. F.\} and Duke, \{C. B.\} and Horng, \{S. F.\} and A. Kahn and Lessor, \{D. L.\} and Mills, \{A. P.\} and A. Paton and K. Stevens and K. Stiles",

year = "1989",

doi = "10.1103/PhysRevLett.62.1876",

language = "English (US)",

volume = "62",

pages = "1876--1879",

journal = "Physical review letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "16",

}

TY - JOUR

T1 - Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

AU - Horsky, T. N.

AU - Brandes, G. R.

AU - Canter, K. F.

AU - Duke, C. B.

AU - Horng, S. F.

AU - Kahn, A.

AU - Lessor, D. L.

AU - Mills, A. P.

AU - Paton, A.

AU - Stevens, K.

AU - Stiles, K.

PY - 1989

Y1 - 1989

N2 - Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.

AB - Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.

UR - https://www.scopus.com/pages/publications/4243766398

UR - https://www.scopus.com/inward/citedby.url?scp=4243766398&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.62.1876

DO - 10.1103/PhysRevLett.62.1876

M3 - Article

C2 - 10039793

AN - SCOPUS:4243766398

SN - 0031-9007

VL - 62

SP - 1876

EP - 1879

JO - Physical review letters

JF - Physical review letters

IS - 16

ER -

Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

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