Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

T. N. Horsky, G. R. Brandes, K. F. Canter, C. B. Duke, S. F. Horng, A. Kahn, D. L. Lessor, A. P. Mills, A. Paton, K. Stevens, K. Stiles

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Abstract

Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.

Original languageEnglish (US)
Pages (from-to)1876-1879
Number of pages4
JournalPhysical review letters
Volume62
Issue number16
DOIs
StatePublished - Jan 1 1989

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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