The nonlinear index of refraction in a resonant region has been determined by the use of a fiber–based Mach-Zehnder interferometer to measure the temporal fringe shift between two signals. The measurement technique is direct and does not require additional amplitude information for the extraction of the nonlinear index of refraction. This technique has been used to measure the temporal response of an InGaAsP semiconductor optical amplifier at 1.313 μm.
|Original language||English (US)|
|Number of pages||4|
|State||Published - Mar 20 1996|
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering