Nonlinear–index–of–refraction measurement in a resonant region by the use of a fiber mach–zehnder interferometer

K. I. Kang; T. G. Chang; I. Glesk; P. R. Prucnal

doi:10.1364/AO.35.001485

Nonlinear–index–of–refraction measurement in a resonant region by the use of a fiber mach–zehnder interferometer

K. I. Kang, T. G. Chang, I. Glesk, P. R. Prucnal

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15 Scopus citations

Abstract

The nonlinear index of refraction in a resonant region has been determined by the use of a fiber–based Mach-Zehnder interferometer to measure the temporal fringe shift between two signals. The measurement technique is direct and does not require additional amplitude information for the extraction of the nonlinear index of refraction. This technique has been used to measure the temporal response of an InGaAsP semiconductor optical amplifier at 1.313 μm.

Original language	English (US)
Pages (from-to)	1485-1488
Number of pages	4
Journal	Applied Optics
Volume	35
Issue number	9
DOIs	https://doi.org/10.1364/AO.35.001485
State	Published - Mar 20 1996

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.35.001485

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abstract = "The nonlinear index of refraction in a resonant region has been determined by the use of a fiber–based Mach-Zehnder interferometer to measure the temporal fringe shift between two signals. The measurement technique is direct and does not require additional amplitude information for the extraction of the nonlinear index of refraction. This technique has been used to measure the temporal response of an InGaAsP semiconductor optical amplifier at 1.313 μm.",

author = "Kang, {K. I.} and Chang, {T. G.} and I. Glesk and Prucnal, {P. R.}",

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AU - Glesk, I.

AU - Prucnal, P. R.

PY - 1996/3/20

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N2 - The nonlinear index of refraction in a resonant region has been determined by the use of a fiber–based Mach-Zehnder interferometer to measure the temporal fringe shift between two signals. The measurement technique is direct and does not require additional amplitude information for the extraction of the nonlinear index of refraction. This technique has been used to measure the temporal response of an InGaAsP semiconductor optical amplifier at 1.313 μm.

AB - The nonlinear index of refraction in a resonant region has been determined by the use of a fiber–based Mach-Zehnder interferometer to measure the temporal fringe shift between two signals. The measurement technique is direct and does not require additional amplitude information for the extraction of the nonlinear index of refraction. This technique has been used to measure the temporal response of an InGaAsP semiconductor optical amplifier at 1.313 μm.

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Nonlinear–index–of–refraction measurement in a resonant region by the use of a fiber mach–zehnder interferometer

Abstract

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